Skoltech Team

   Full Name

   Position and Title    CREI or Department Name    Email
Prof. Albert G. Nasibulin Professor, Dr. Sci., PhD. Photonics and Quantum Materials
Evgenia Gilshteyn PhD student Photonics and Quantum Materials
Yury Gladush Research Scientist Photonics and Quantum Materials
Anastasia Goldt Research Scientist Photonics and Quantum Materials
Daria Kopylova Research Scientist Photonics and Quantum Materials
Vsevolod Iakovlev PhD student Photonics and Quantum Materials

Available Resources and Budget

Skoltech’s Laboratory of Nanomaterials (LNM) possesses all the required equipment to carry out high scientific level experiments in the field of synthesis of carbon nanomaterials, their characterization and fabrication of various devices. Optical properties of SWCNT films are examined using a Perkin Elmer Lambda-1050 UV/Vis/NIR Spectrophotometer (175 – 3300 nm), Ocean Optics QE Pro spectrophotometer with a deuterium-halogen light source and Bruker VERTEX 70 FT-IR Spectrometer (wavelengths: 1.25 – 28.57 μm. Electrical properties of films are measured with a 4-point linear probe (Jandel 4 point probe), current source and a digital voltmeter (Jandel RM3000 Test Unit), Suragus EddyCus TF lab 2020 Non-Contact Sheet Resistance. Film thicknesses can be measured with a Leica Layer Thickness Measurement Device. Equipment for electrical properties characterization includes Probe Station MPI TS 150, connected with B1500A Semiconductor Device Parameter Analyzer. Keysight B1500A Semiconductor Device Analyzer is available for IV, CV, pulse/dynamic IV and other measurements. A DSOX3054A Oscilloscope, 500 MHz, with 4 Channels is also available at the Laboratory for measurements of voltage, current, frequency and phase angle. LNM operates advanced two scanning and transmission electron microscopes available at the Skoltech Center for common use: Helios NanoLab 660 SEM, FEI Versa 3D DualBeam SEM, FEI Tecnai G2 F20 TEM.